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A comprehensive workflow for analyzing Ti-6Al-4V synchrotron diffraction data using exploratory diffraction analysis, principal component analysis (PCA), peak tracking, similarity and transition analysis, automated diffraction-window ranking, full-pattern partial least squares (PLS) regression, phase evolution mapping, and reduced-window chemometric modeling. The workflow provides an end-to-end framework for identifying diffraction-state evolution, characterizing α/β phase transformations, and predicting phase composition from full diffraction patterns and selected diagnostic diffraction windows.