In semiconductor manufacturing, wafers are produced in batches, and each wafer contains hundreds or even thousands of individual chips. During the production process, defects can occur such as dust landing on the wafer, or misalignment during lithography. These defects can affect performance or yield of the chips. We will demo a process control task where we monitor defects on wafers.

Visualizations based on Accounting industry salary and employment data from May 2024.

for MATH 3042

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